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Our Services » EOS » EOS Root Cause Analysis
CBE | CBE Technical Assessment | Root Cause Analysis | EOS Seminar Outline
Note: Conducted by our most experienced Engineers and Scientists with advanced degrees and/or specialized expertise including product ESD designed-in protection.
We are uniquely equipped to efficiently locate the root cause of EOS damage in complex manufacturing operations due to our team of advanced engineering experts and over 200 years experience. Thus, it is possible to readily analyze sophisticated automated or manual production lines and pinpoint the root cause of EOS failure.
Once the root cause has been identified we can draw on our depth of experience and technical understanding of the physics of EOS to efficiently resolve manufacturing issues or to redesign products to enhance designed-in protection.