EOS is an electrical operation of device outside that device’s current or voltage ratings, leading to either damage, malfunction or accelerated aging. Failure analysis of electronic components has cited EOS as the most common source of failure for decades. Recent data and experience reported by several companies and laboratories now indicate that many failures previously classified as EOS are instead the result of ESD failures due to Charged Board Events (CBE) or Cable Discharge Event (CDE). It is estimated that approximately 50% of so called EOS failures are actually ESD. We have had clients that realized 80% reductions in EOS failures with the implementation of our CBE and CDE counter measures.