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FAILURE MODE ANALYSIS
Determination of the root cause of device failure is a highly complex analysis and requires many years of experience and PhD. expertise. Thus, we are uniquely qualified to differentiate between EOS and ESD failures as well as between HBM and CDM and CBE failures. Our partners perform the lab analysis and we analyze the reports to pin point the root cause of failure. We can also direct stress lab activities to replicate the failure signature.
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- Root Cause Determination
- Differentiation
- EOS vs. ESD
- CDM vs. HBM vs. CBE
- FA Report Analysis & Interpretation
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