“An investment in knowledge always pays the best interest.”Benjamin Franklin
Education » Seminars & Events ARCHIVES
2012 – 2022
Dangelmayer Associates is a big proponent of educational activities of ESD Control and Practices. Involvement includes the development, participation, and delivery of frequent seminars, events, tutorials and other ESD Educational activities world-wide. A current listing of their ESD Seminars and Events is provided below.
November 2011
November 17
Electrostatic Calculations for the Program Manager, Part 4
Time: 11:00 a.m. US/Eastern Time (3:00 p.m. GMT)
Location: Webinar: Four-one hour online courses, Part 1 - July 19th, Part 2 - October 18th, Part 3 - November 3rd, Part 4 - November 17th
Instructors: Terry Welsher, Dangelmayer Associates, L.L.C.; Leo G. Henry, ESD/TLP Consultants, L.L.C.
Reserve your Webinar seat now at: Space is limited. https://www1.gotomeeting.com/register/627711249
More Info: This on-line tutorial is a four part series on Electrostatic Calculations. The material included is the same as is included in the full tutorial usually presented at the EOS/ESD Symposium or ESDA Regional Tutorials. The four parts focus on the basic calculations and techniques of use to the Program Manager and the ESD engineer. The content is at the introductory high school or college pre-calculus and introductory college physics level set in the context of electrostatic discharge and its effects. Each part also includes an additional review of the mathematics used in the practical calculations.
In Part One the topics covered include the electric force, the electric field and Coulombs law, electric potential and voltage. Gauss' Law is discussed as it relates to the electric field, induction and the Faraday cup.
Part Two covers capacitance, the fundamental equation Q = CV, the parallel plate capacitor, stored and transferred energy and electrical resistance.
Part Three covers static decay as it relates to charge flow from humans, devices, wrist straps, dissipative materials and air ionization.
Part Four covers relationships among ESD device testing methods and simple models for estimating failure levels of devices in terms of peak current, power, energy and threshold voltage for simple devices.
To receive a hard copy of the presentation in time for the course, registrations must be completed two weeks prior to the course date.
Cost: | members | non-members |
---|---|---|
Each course | $95.00 | $140.00 |
All Four courses | $380.00 | $560.00 |
Note: Taking all four parts of this online calculations class will fill the requirement for the full length calculations tutorial that is part of the ESDA Program Manager Certification curriculum. Details on the Professional Certification Programs offered by ESDA are on our website at www.esda.org/certification.htmlThe Calculations class is recommended to help prepare for the iNARTE ESD Engineer exam. For details visit www.esda.org/nartecert.html
November 3
Electrostatic Calculations for the Program Manager, Part 3
Time: 11:00 a.m. US/Eastern Time (3:00 p.m. GMT)
Location: Webinar: Four-one hour online courses, Part 1 - July 19th, Part 2 - October 18th, Part 3 - November 3rd, Part 4 - November 17th
Instructors: Terry Welsher, Dangelmayer Associates, L.L.C.; Leo G. Henry, ESD/TLP Consultants, L.L.C.
Reserve your Webinar seat now at: Space is limited. https://www1.gotomeeting.com/register/627711249
More Info: This on-line tutorial is a four part series on Electrostatic Calculations. The material included is the same as is included in the full tutorial usually presented at the EOS/ESD Symposium or ESDA Regional Tutorials. The four parts focus on the basic calculations and techniques of use to the Program Manager and the ESD engineer. The content is at the introductory high school or college pre-calculus and introductory college physics level set in the context of electrostatic discharge and its effects. Each part also includes an additional review of the mathematics used in the practical calculations.
In Part One the topics covered include the electric force, the electric field and Coulombs law, electric potential and voltage. Gauss' Law is discussed as it relates to the electric field, induction and the Faraday cup.
Part Two covers capacitance, the fundamental equation Q = CV, the parallel plate capacitor, stored and transferred energy and electrical resistance.
Part Three covers static decay as it relates to charge flow from humans, devices, wrist straps, dissipative materials and air ionization.
Part Four covers relationships among ESD device testing methods and simple models for estimating failure levels of devices in terms of peak current, power, energy and threshold voltage for simple devices.
To receive a hard copy of the presentation in time for the course, registrations must be completed two weeks prior to the course date.
Cost: | members | non-members |
---|---|---|
Each course | $95.00 | $140.00 |
All Four courses | $380.00 | $560.00 |
Note: Taking all four parts of this online calculations class will fill the requirement for the full length calculations tutorial that is part of the ESDA Program Manager Certification curriculum. Details on the Professional Certification Programs offered by ESDA are on our website at www.esda.org/certification.htmlThe Calculations class is recommended to help prepare for the iNARTE ESD Engineer exam. For details visit www.esda.org/nartecert.html
October 2011
October 18
Electrostatic Calculations for the Program Manager, Part 2
Time: 11:00 a.m. US/Eastern Time (3:00 p.m. GMT)
Location: Webinar: Four-one hour online courses, Part 1 - July 19th, Part 2 - October 18th, Part 3 - November 3rd, Part 4 - November 17th
Instructors: Terry Welsher, Dangelmayer Associates, L.L.C.; Leo G. Henry, ESD/TLP Consultants, L.L.C.
Reserve your Webinar seat now at: Space is limited. https://www1.gotomeeting.com/register/627711249
More Info: This on-line tutorial is a four part series on Electrostatic Calculations. The material included is the same as is included in the full tutorial usually presented at the EOS/ESD Symposium or ESDA Regional Tutorials. The four parts focus on the basic calculations and techniques of use to the Program Manager and the ESD engineer. The content is at the introductory high school or college pre-calculus and introductory college physics level set in the context of electrostatic discharge and its effects. Each part also includes an additional review of the mathematics used in the practical calculations.
In Part One the topics covered include the electric force, the electric field and Coulombs law, electric potential and voltage. Gauss' Law is discussed as it relates to the electric field, induction and the Faraday cup.
Part Two covers capacitance, the fundamental equation Q = CV, the parallel plate capacitor, stored and transferred energy and electrical resistance.
Part Three covers static decay as it relates to charge flow from humans, devices, wrist straps, dissipative materials and air ionization.
Part Four covers relationships among ESD device testing methods and simple models for estimating failure levels of devices in terms of peak current, power, energy and threshold voltage for simple devices.
To receive a hard copy of the presentation in time for the course, registrations must be completed two weeks prior to the course date.
Cost: | members | non-members |
---|---|---|
Each course | $95.00 | $140.00 |
All Four courses | $380.00 | $560.00 |
Note: Taking all four parts of this online calculations class will fill the requirement for the full length calculations tutorial that is part of the ESDA Program Manager Certification curriculum. Details on the Professional Certification Programs offered by ESDA are on our website at www.esda.org/certification.htmlThe Calculations class is recommended to help prepare for the iNARTE ESD Engineer exam. For details visit www.esda.org/nartecert.html
September 2011
Sep 15
Electronics Industry Summit
Experts on the Concerns and Issues of Today’s Electronics’ Industry
Time: 8:30 AM—3:30 PM (Doors will open for guests at 8:00AM)
Location: Kimball Electronics
Tampa 13750 Reptron Blvd. Tampa, FL 33626
Round Table Discussion: Ted Dangelmayer, Dangelmayer Associates, L.L.C. and others
More Info: Electronics Industry Summit Agenda
Join us for the chance to collaborate with fellow leading OEM supply chain and engineering experts.
Sep 11
EOS/ESD Symposium – ESD Basics Seminar
Time: T.B.A.
Location: Anaheim, CA
Instructors: Terry Welsher & Ted Dangelmayer, Dangelmayer Associates, L.L.C.
More Info: go to ESD Association’s website
July 2011
July 26, 27, & 28
Hands-on ESD Workshop - Today's Challenges!
Class 0, S20.20, EOS, CDM, & Advanced Auditing
All New Hands-on Class Exercises!
Time: 8:00 AM - 5:00 PM EDT
Location: Dangelmayer Associates, 14 Butternut Lane, Cape Ann, Gloucester, MA
Instructors: Ted Dangelmayer, Terry Welsher, Ginger Hansel, Larry FRomm, Carl Newberg, Arnie STeinman, Min-Chung Jon, Lou DeChiaro and Vicki Dangelmayer, all of Dangelmayer Associates, L.L.C and invited speaker: David Long of Staticworx.
Early Registration Discount until 6/30, $1635.00 2011 ESD Dream Team Workshop $1785.00
Registration Info: Contact: Vicki Dangelmayer; vicki@dangelmayer.com; 978-283-5156
More Info in PDF Workshop Flyer: ESD_Workshop_July_2011-Todays_Challenges.pdf
July 19
Electrostatic Calculations for the Program Manager, Part 1
Time: 11:00 a.m. US/Eastern Time (3:00 p.m. GMT)
Location: Webinar: Four-one hour online courses, Part 1 - July 19th, Part 2 - October 18th, Part 3 - November 3rd, Part 4 - November 17th
Instructors: Terry Welsher, Dangelmayer Associates, L.L.C.; Leo G. Henry, ESD/TLP Consultants, L.L.C.
Reserve your Webinar seat now at: Space is limited. https://www1.gotomeeting.com/register/627711249
More Info: This on-line tutorial is a four part series on Electrostatic Calculations. The material included is the same as is included in the full tutorial usually presented at the EOS/ESD Symposium or ESDA Regional Tutorials. The four parts focus on the basic calculations and techniques of use to the Program Manager and the ESD engineer. The content is at the introductory high school or college pre-calculus and introductory college physics level set in the context of electrostatic discharge and its effects. Each part also includes an additional review of the mathematics used in the practical calculations.
In Part One the topics covered include the electric force, the electric field and Coulombs law, electric potential and voltage. Gauss' Law is discussed as it relates to the electric field, induction and the Faraday cup.
Part Two covers capacitance, the fundamental equation Q = CV, the parallel plate capacitor, stored and transferred energy and electrical resistance.
Part Three covers static decay as it relates to charge flow from humans, devices, wrist straps, dissipative materials and air ionization.
Part Four covers relationships among ESD device testing methods and simple models for estimating failure levels of devices in terms of peak current, power, energy and threshold voltage for simple devices.
To receive a hard copy of the presentation in time for the course, registrations must be completed two weeks prior to the course date.
Cost: | members | non-members |
---|---|---|
Each course | $95.00 | $140.00 |
All Four courses | $380.00 | $560.00 |
July 7
ASQ RD Short Courses: Part 2 of 2 Electrostatic Discharge (ESD) and Electrical Overstress (EOS) Design Challenges
Time: 11:00 AM - 12:00 PM EDT
Location: Webinar
Instructors: Terry Welsher and Ted Dangelmayer, Dangelmayer Associates, L.L.C.
Reserve your Webinar seat now at: Space is limited. https://www1.gotomeeting.com/register/627711249
More Info: The ASQ Reliability Division is pleased to present short courses featuring leading national and international practitioners, academics, and consultants. The series provides continuing education for reliability professionals in an effort to keep us current on the broad range of topics within reliability engineering.
Registration is free. Note: we are using a long-distance call-in number or VoIP - thus long distance charges may apply.
In this seminar, we discuss the challenges designers will be facing over the next several years. Changes in technology will continue to put pressure on designers to provide adequate protection but often without good information or tools. Highlights of the following will be covered: The shrinking design window for CMOS integrated circuits; changes in component level ESD threshold targets and the lack of availability of component information; the implications of new packaging and interconnect technologies such as through silicon vias (TSV); design of system connection and user interfaces; the use and misuse of component level ESD information for system level protection and emerging methods for co-design; and the evolution of EOS/ESD testing methods and standards.
Bio:
Ted Dangelmayer is the president of Dangelmayer Associates, L.L.C. and has assembled an ESD consulting team consisting of the foremost authorities in virtually all ESD areas of both product development and manufacturing. He received the “Outstanding Contributor” award, The ESD Association Founders Award, was President of the ESD Association, Chairman of the ESDA Standards Committee, and General Chairman of the EOS/ESD Symposium.
System Requirements
PC-based attendees
Required: Windows® 7, Vista, XP or 2003 Server
Macintosh®-based attendees
Required: Mac OS® X 10.4.11 (Tiger®) or newer
July 6
ASQ RD Short Courses: Part 1 of 2 Broad Impact of Electrostatic Discharge (ESD) on Product Quality and Reliability
Time: 11:00 AM - 12:00 PM EDT
Location: Webinar
Instructors: Terry Welsher and Ted Dangelmayer, Dangelmayer Associates, L.L.C.
Reserve your Webinar seat now at: Space is limited. https://www1.gotomeeting.com/register/238643273
More Info: CThe ASQ Reliability Division is pleased to present short courses featuring leading national and international practitioners, academics, and consultants. The series provides continuing education for reliability professionals in an effort to keep us current on the broad range of topics within reliability engineering.
Registration is free. Note: we are using a long-distance call-in number or VoIP - thus long distance charges may apply.
In this seminar we present a broad survey of the impacts including this EOS misdiagnosis issue. The best known effects, those on integrated circuits, will be discussed and the implications of the IC technology and packaging roadmaps will be discussed. We will also describe the effects on other areas including MEMS, flat panel displays, phototools, manufacturing equipment, hand-held devices and operating systems. In each case we will describe how ESD caused failure or malfunction.
Bio:
Ted Dangelmayer is the president of Dangelmayer Associates, L.L.C. and has assembled an ESD consulting team consisting of the foremost authorities in virtually all ESD areas of both product development and manufacturing. He received the “Outstanding Contributor” award, The ESD Association Founders Award, was President of the ESD Association, Chairman of the ESDA Standards Committee, and General Chairman of the EOS/ESD Symposium.
System Requirements
PC-based attendees
Required: Windows® 7, Vista, XP or 2003 Server
Macintosh®-based attendees
Required: Mac OS® X 10.4.11 (Tiger®) or newer
May 2011
May 5
Northeast Regional Tutorial, Hands-on ESD Test Equipment Workshop: Uses and Pitfalls of ESD Measurements
Time: 1:00 p.m. - 4:30 p.m.
Location: Teradyne Conference Center, North Reading, MA
Instructors: Ted Dangelmayer, Dangelmayer Associates, L.L.C.
More Info: go to ESD Association’s website
More Info: Come join us for this highly interactive hands-on workshop on the proper use of ESD test equipment. Pitfalls of common instruments will be explained as well as the invalid test results that can result. For instance, static locators can yield totally invalid readings when used incorrectly due to voltage suppression. Demonstrations will be used to illustrate both the pitfalls and correct measurement techniques for instruments such as static locators, ionizers, EMI/ESD Event Detectors, and Resistance meters. Find out if static locators can be used accurately to test automation equipment, conveyor belts, document carriers with paper inside, ionizers or rapidly moving operations? Each student will participate in Class exercises to perform these tests and to experience the benefits of correct test methods as well as the incorrect results created by the pitfalls. Approximately half of this workshop will be devoted to these hands-on class exercises.
May 4
Northeast Regional Tutorial, Part I, ESD Damage - A Surprisingly Dominant Failure Mechanism!
Time: 8:30 a.m. - 10:00 a.m.
Location: Teradyne Conference Center, North Reading, MA
Instructors: Ted Dangelmayer, Dangelmayer Associates, L.L.C.
More Info: go to ESD Association’s website
More Info: While most companies are acutely aware of the hazards of ESD (electrostatic discharge), few are aware of just how pervasive ESD failures actually are. Recent studies into the misdiagnosis of these failures suggest that ESD damage may, in fact, be the dominant failure mechanism on the factory floor and in the field. This includes all sources of device failure such as EOS, ESD, Contamination, Charged Board Event, Cable Discharge Event, device fabrication etc. You will also learn which are the dominate ESD failure mechanisms among CDM, HBM and MM. Attend this highly interactive tutorial and learn the latest facts about ESD damage and about current best practices for ESD damage prevention.
May 4
Northeast Regional Tutorial, Part II, Electrical Overstress (EOS) in Manufacturing Many Failures from Many Sources.
Time: 10:30 a.m. - 4:30 p.m.
Location: Teradyne Conference Center, North Reading, MA
Instructors: Terry Welsher, Dangelmayer Associates, L.L.C.
More Info: go to ESD Association’s website
More Info: Electrical overstress (EOS) is a major cause of device failure in manufacturing and in the field. Despite this there is relatively little information on the sources of EOS and on prevention practices, particularly for the factory. In this tutorial, the fundamentals of device overstress are reviewed. Relationships among device EOS stressing models are discussed. The causes of EOS and EOS-like events in manufacturing are described and categorized by source and by stress-type. Case histories, including failure analysis and root cause determination, are presented and the few relevant industry specifications are reviewed. An outline for an "EOS control" program similar to ESD control is presented.
March 2011
Mar 1-2
ESD Tutorials - ESD Basics
Time: T.B.A.
Location: 3M Innovation Center, 6801 River Place Blvd., Austin, TX
Instructors: Ted Dangelmayer & Dr. Terry L. Welsher, Dangelmayer Associates, L.L.C.
More Info: go to Texas ESD Association’s website
ESD Basics by Ted Dangelmayer & Terry Welsher of Dangelmayer Associates, L.L.C. Tutorials to be had at at 3M Innovation Center, 6801 River Place Blvd., Austin, TX
Mar 1-2
ESD Tutorials - How To's of Auditing Measurements
Time: T.B.A.
Location: 3M Innovation Center, 6801 River Place Blvd., Austin, TX
Instructors: Ted Dangelmayer & Carl Newberg, Dangelmayer Associates, L.L.C.
More Info: go to Texas ESD Association’s website
How To’s of Auditing Measurements. Tutorials to be had at at 3M Innovation Center, 6801 River Place Blvd., Austin, TX
November 2010
Nov 18
ESD Webinar: Automation Advanced Qualification Test Methods
Time: TBA
Location: Online
Instructors: Dangelmayer Associates, L.L.C.
Webinar Info: Click for More Info
Nov 11 (Penang), Nov 17 (Taiwan)
iNARTE Certification Exam
Time: 8:00 a.m. - 5:00 p.m.
Location: Penang Skills Development Centre, Penang and Lakeshore Hotel Headquarter, Taiwan
Cost: $250.00 USD
Flyer: download PDF Flyer
Registration: online
There are no required tutorials or courses prior to attempting the iNARTE Certification exam. Applicants must complete an application form and submit application fee. For more information on the requirements and application forms for iNARTE Certification see http://www.narte.org/h/esd.asp
Nov 9-10 (Penang), Nov 15-16 (Taiwan)
Essentials for ESD Programs
Time: 8:00 a.m. - 5:00 p.m.
Location: Penang Skills Development Centre, Penang and Lakeshore Hotel Headquarter, Taiwan
Instructors: Ted Dangelmayer, Dr. Terry L. Welsher, Dangelmayer Associates, L.L.C.
Cost: before Oct. 19, 2010 $600.00 USD, after Oct. 19, 2010 $700.00 USD
Flyer: download PDF Flyer
Registration: online
This two-day seminar consists of concentrated versions of the ten ESDA tutorials which comprise the ESDA Program Manager Certification Program:
- ESD Basics for the Program Manager
- Ionization Issues and Answers for the Program Manager
- Packaging Principles for the Program Manager
- System Level ESD/EMI: Testing to IEC and Other Standards
- Cleanroom Considerations for the Program Manager
- How To’s of In-Plant ESD Survey and Evaluation Measurements
- Device Technology and Failure Analysis Overview
- Electrostatic Calculations for the Program Manager and the ESD Engineer
- ESD Standards Overview for the Program Manager
- ESD Program Development & Assessment (ANSI/ESD S20.20 Seminar)
Key concepts and information from the above courses have been selected for this two day seminar. Many of the demonstrations and videos from ESD Basics Tutorial are included in this seminar. Examples of electrostatics and ESD calculations are included where appropriate throughout the seminar.
This Seminar offers a broad exposure to the essentials of ESD programs. It offers a two-day comprehensive set of factory technologies and procedures designed for managers, technicians, and specialists desiring ESD control program training and information. This course serves as a refresher class to those taking the PrM Certification exam. In addition, the course can be used as preparation for those interested in taking the iNARTE Engineering or Technician Certification exam.
October 2010
Oct 28
Compliance Verification: Pitfalls of Auditing
Time: 11:00 a.m. Eastern Time • Course Length - One Hour
Location: Online
Instructors: Ginger Hansel, Dangelmayer Associates, L.L.C.
Cost: members: $95.00, non-members: $140.00
Flyer: download PDF Flyer
Registration: download
Accurate data is the foundation of effective ESD Program Management. Therefore, it's important to have confidence in the measurements. Choosing the correct type of equipment for each measurement is also important and not always obvious.
The class will cover the correct use of static locators, resistance meters, event detectors, and how to use ionizers effectively. We will discuss the various pitfalls of commonly used instruments, and the invalid test results that can result. For instance, static locators can yield totally invalid readings when used incorrectly due to voltage suppression. What you learn will help you avoid frequently encountered auditing problems, and improve your compliance verification program.
Questions can be submitted in advance to be answered as part of the course. Email your questions to info@esda.org, please specify "Online class question-Compliance Verification-Pitfalls of Auditing" in the subject line.
Registration is requested by Oct 7th to guarantee course scheduling Registrations will be accepted until October 27th
Oct 21
Joint ESD Webinar with DfR Solutions:
ESD Damage - The Surprisingly Dominant Failure Mechanism!
Time: 2 PM EDT
Location: Online
Cost: $75.00
General Webinar Info: Click for More Info
Title: ESD Damage – The Surprisingly Dominant Failure Mechanism!
Is ESD the #1 cause of device failure?
Abstract: While most companies are acutely aware of the hazards of ESD (electrostatic discharge), few are aware of just how pervasive ESD failures actually are. Recent study into the misdiagnosis of these failures suggest that ESD damage may, in fact, be a dominant failure mechanism on the factory floor and in the field. Attend this joint webinar hosted by Dangelmayer Associates and DfR Solutions and learn the latest facts about ESD damage, failure analysis, and design-related ESD damage prevention techniques. The topics to be discussed include:
- Introduction to Dangelmayer Associates &DfR Solutions & Speakers
- EOS & ESD Impact & Roadmap, device sensitivities and procedures (Industry Council)
- Defect analysis pareto
- EOS & ESD dominance
- ESD Models – Brief Background & Overview
- Event characteristics – Comparing energy/power/risetime
- Human Body Model (HBM), Charged Device Model (CDM), Electrical Overstress (EOS) differentiation
- Board & Assembly Level Models
- Charged Board Event: CBE
- Cable Discharge Event: CDE
- EOS Diagnosis & Misdiagnosis – Case Studies
- How did they come to this determination? Tools.Models.Information.
- Failure Analysis tools typically used for EOS/ESD/EOL
- Other similar failures that are commonly mischaracterized
- Damage Prevention Techniques
- Design Solutions
- IC Level Protection Strategies
- Board-Level (off chip) Design Solutions
- Manufacturing Solutions
- CDM Techniques
- CDE Techniques
- EOS Techniques
Oct 4
2010 EOS/ESD Symposium – Tutorial K: How To’s of In–Plant ESD Survey and Evaluation Measurements
Time: 8:30 a.m. - 4:30 p.m
Location: John Ascuaga's Nugget Resort, Sparks, NV, USA
Instructors: Ted Dangelmayer & Carl Newberg, Dangelmayer Associates, L.L.C.
Flyer: download PDF Flyer
Registration: online
Accurate data is the foundation of effective ESD Program Management. Therefore, it's important to have confidence in the measurements. Choosing the correct type of equipment for each measurement is also important and not always obvious.
Oct 4
2010 EOS/ESD Symposium – Tutorial L: Ionization Issues and Answers for the Program Manager
Time: 8:30 a.m. - 12:00 p.m.
Location: John Ascuaga's Nugget Resort, Sparks, NV, USA
Instructors: Arnold J. Steinman, Dangelmayer Associates, L.L.C.
Flyer: download PDF Flyer
Registration: online
The primary method of static charge control is direct connection to ground for conductors, static dissipative materials, and personnel. But a complete static control program must also deal with isolated conductors, insulating materials, and moving objects that cannot be grounded. Air ionization can neutralize the charge on insulated and isolated objects. This seminar will present the information needed to use ionizers to solve problems caused by static charge. It will first examine the problems caused by static charges in a variety of workplaces, and then review the common methods by which static charges are generated and controlled. Demonstrations will be done to illustrate basic principles, leading to an understanding of why ionizers must be included in a static control program. The major types of ionizers and their use environments will be explained. Electrical and performance test methods will be discussed in detail. Ionization measurements using the Ionization Standard will be demonstrated. Installation, safety, maintenance, and contamination issues will be presented. Finally, a number of case histories will be analyzed illustrating the use of ionizers in a variety of work environments.
Oct 3
2010 EOS/ESD Symposium – Tutorial F: Perfect ESD Storm
Time: 8:30 a.m. - 10:00 a.m/
Location: John Ascuaga's Nugget Resort, Sparks, NV, USA
Instructors: Ted Dangelmayer, Dangelmayer Associates, L.L.C.
Flyer: download PDF Flyer
Registration: online
Learn how to prepare for the “Perfect ESD Storm” that is brewing in the electronics industry. The trend towards extensive use of ultra-sensitive components (Class 0) and the widespread lack of CDM (Charge Device Model) understanding are brewing the “Perfect ESD Storm”. It is no longer business as usual, and it can take up to two years to prepare. This tutorial is intended for professional who have a basic understanding of ESD but are nto fully aware of CDM control techniques or the industry trend towar extremely sensitive devices and the counter measures that are necessary. Learn the answers to your questions as well as these examples. Are you skeptical about this news of Class 0 trend? Is it really happening? Is it likely to be a problem in your factory? How big a problem is CDM in manufacturing? What is different about CDM controls? How do I tailor ANSI/ESD S20.20 for CDM and Class 0? Join us for this highly interactive tutorial and learn why this is inevitable and how to prepare for it.
2009 - 2010
November 9-10, 2010
or
November 15-16, 2010
Time: 8:00 a.m. - 5:00 p.m.
Instructors: Ted Dangelmayer, Dr. Terry L. Welsher, Dangelmayer Associates, L.L.C.
Location:
Penang Skills Development Centre, Penang
or
Lakeshore Hotel Headquarter, Taiwan
For flyer and registration info: download PDF Flyer
Cost:
On or before Oct. 19, 2010 $600.00 USD
After Oct. 19, 2010 $700.00 USD
Register online at http://esda.org/onlineregistrations.html
Essentials for ESD Programs
This two-day seminar consists of concentrated versions of the ten ESDA tutorials which comprise the ESDA Program Manager Certification Program:
· ESD Basics for the Program Manager
· Ionization Issues and Answers for the Program Manager
· Packaging Principles for the Program Manager
· System Level ESD/EMI: Testing to IEC and Other Standards
· Cleanroom Considerations for the Program Manager
· How To's of In-Plant ESD Survey and Evaluation Measurements
· Device Technology and Failure Analysis Overview
· Electrostatic Calculations for the Program Manager and the ESD Engineer
· ESD Standards Overview for the Program Manager
· ESD Program Development & Assessment (ANSI/ESD S20.20 Seminar)
Key concepts and information from the above courses have been selected for this two day seminar. Many of the demonstrations and videos from ESD Basics Tutorial are included in this seminar. Examples of electrostatics and ESD calculations are included where appropriate throughout the seminar.
This Seminar offers a broad exposure to the essentials of ESD programs. It offers a two-day comprehensive set of factory technologies and procedures designed for managers, technicians, and specialists desiring ESD control program training and information. This course serves as a refresher class to those taking the PrM Certification exam. In addition, the course can be used as preparation for those interested in taking the iNARTE Engineering or Technician Certification exam.
November 11, 2010, Penang
or
November 17, 2010, Taiwan
Time : 8:00 a.m. - 5:00 p.m.
Location:
Penang Skills Development Centre, Penang
or
Lakeshore Hotel Headquarter, Taiwan
For flyer and registration info: download PDF Flyer
Cost:
$250.00 USD
Register online at http://esda.org/onlineregistrations.html
iNARTE Certification Exam
There are no required tutorials or courses prior to attempting the iNARTE Certification exam. Applicants must complete an application form and submit application fee. For more information on the requirements and application forms for iNARTE Certification see http://www.narte.org/h/esd.asp
Oct 28, 2010
Time: 11:00 a.m. Eastern Time • Course Length - One Hour
Instructor: Ginger Hansel, Dangelmayer Associates, L.L.C.
Location: Online
For flyer and registration info: download PDF Flyer
Cost: members non-members
$95.00 $140.00
Registration information
Accurate data is the foundation of effective ESD Program Management. Therefore, it's important to have confidence in the measurements. Choosing the correct type of equipment for each measurement is also important and not always obvious.
The class will cover the correct use of static locators, resistance meters, event detectors, and how to use ionizers effectively. We will discuss the various pitfalls of commonly used instruments, and the invalid test results that can result. For instance, static locators can yield totally invalid readings when used incorrectly due to voltage suppression. What you learn will help you avoid frequently encountered auditing problems, and improve your compliance verification program.
Questions can be submitted in advance to be answered as part of the course. Email your questions to info@esda.org, please specify "Online class question-Compliance Verification-Pitfalls of Auditing" in the subject line.
Registration is requested by Oct 7th to guarantee course scheduling Registrations will be accepted until October 27th
2010 Webinars and Workshops
June 24, 2010
ESD Webinar: Air Ionization: Uses and Limitations for ESD and Cleanroom Applications
September 9, 2010
ESD Webinar: Automation Advanced Auditing Measurements
November 18, 2010
ESD Webinar: Automation Advanced Qualification Test Methods
July 27, 28 & 29, 2010
ESD Workshop - Class 0, CDM, CBE & Class 0 Certification
April 14, 2010
Time: 8:30 a.m. - 12:00 p.m.
Instructor: Arnold Steinman, Electronics Workshop
Location: Bloomington, MN
For complete flyer and registration form: download NC Flyer
Cost before 3/17/10
Members-$295, Non-Members-$395
Cost After 3/17/10
Members-$495, Non-Members-$495
This class is part of the ESDA Program Manager Certification curriculum. More details on the Professional Certification Programs offered by ESDA are on our website at www.esda.org/certification.html
Ionization and Answers for the Program manager
The primary method of static charge control is direct connection to ground for conductors, static dissipative materials, and personnel. But a complete static control program must also deal with isolated conductors, insulating materials, and moving personnel that cannot be grounded. Air ionization can neutralize the charge on insulated and isolated objects.
This seminar will
· Examine problems caused by static charge
· Review common methods for generation and control of static charge
· Establish the importance of ionizers in a static control program through demonstrations
· Illustrate charge generation and control through demonstrations
· Explain the major types of ionizers and the varying environments in which they are used
· Discuss electrical and performance test methods
· Demonstrate ionization measurements using the Ionization Standard
· Present installation, safety, maintenance, and contamination issues
· Analyze case histories of the use of ionizers in a variety of work environments
March 25, 2010
on-line presentation
Course length: 1 hour
Time: 10:00 a.m. Eastern Time
Instructor: Ted Dangelmayer
Dangelmayer Associates, L.L.C.
More Info: Go to PDF Flyer
Cost | members | non-members |
---|---|---|
$95.00 | $140.00 |
Please Register by March 11th
For registration information visit:
Registration in PDF Format
Stay Educated! Stay Current!
Ultra-Sensitivity Trends and CDM
Online Training
The electronics industry faces a double challenge: increasing use of ultra sensitive devices and lack of experience with the Charge Device Model (CDM). This class will give you the background to understand the challenges and prepare to meet them. Case studies will illustrate how CDM failures can persist even with a robust HBM program in place. A series of photographs of common CDM issues in manufacturing will enable students to visualize how to implement CDM controls. A brief summary of the work by the Industry Council on ESD Target Levels will be included.
It is no longer business as usual and it could take up to two years to prepare (example - equipment retooling etc.). Join us for this highly interactive tutorial and learn why these challenges are inevitable and how to prepare for them.
Get the answers to your questions as well as these examples. Are you skeptical about this news of the trend toward the extensive use of ultrasensitive components? Is it really happening? Is it likely to be a problem in your factory? How big a problem is CDM in manufacturing? What is different about CDM controls?
March 18, 2010 - 2:00pm to 3:30pm EST
Speakers: Ted Dangelmayer & Carl Newberg, Danglemayer Associates, LLC
Location: The Internet (Webinar)
Developed by: Danglemayer Associates, LLC
Cost:
$235 per Webinar registrant
$295 per Slide Set (for Webinar registrants)
$395 per Slide Set for non-registrants
More Info:
WHO SHOULD ATTEND This tutorial is intended for professionals who have a basic understanding of ANSI S20.20 but are not fully aware of the strengths and limitations. THE WEBINAR FORMAT A live Webinar is one that you can "attend" and participate in right from your office. The savings are significant - no travel time or hassle and no travel expense. It's easy; you only need a telephone or VoIP and access to the Internet. The audio portion is delivered over the telephone or VoIP for reliable and clear sound quality. At the same time, talk with the experts as you view the speakers' Power Point presentation. The Webinar is also interactive so you will be able to ask questions of the experts and provide comments during the course of the program. Questions may be submitted prior to the Webinar by e-mail to Kristin@Dangelmayer.com.
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WEBINAR INFORMATION Date: March 18, 2010 Time: 2:00 pm to 3:30 pm EST Dial-in instructions as well as the URL address for accessing the Webinar will be e-mailed to you one week before the program. WEBINAR FEES $235 per registrant Please note: Your registration entitles you to one telephone connection and one computer connection at one physical location. Group discounts are available upon request. Any transmission, retransmission, or republishing of the audio or web portion of this program is strictly prohibited. International registrants may incur additional phone charges. $295 for Webinar registrants $395 for non-registrants CANCELLATION: Phone - 1-978-281-4567 to order with a credit card Fax - Complete and fax the attached registration form to 1-978-282-4884 Mail - Complete and mail attached registration form to: Dangelmayer Associates, L.L.C.
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ESD Webinar - ANSI S20.20 Strengths and Limitations
ANSI S20.20 - 2007 is the best ESD standard available for manufacturing handling practices. It is becoming widely recognized within the electronics industry, defense manufacturing and the FDA, and many sites have been certified. This success speaks well of the many strengths of S20.20. As with any standard, however, there is an intended application and scope that limits the applicability. For instance, ESD Class 0 has unique and complex requirements that require significant customization of the requirements of S20.20.
Join us for this highly interactive Webinar and learn not only about the strengths but also how to customize S20.20 to address current technological ESD challenges such as Class 0, CDM and Charged Board Events (CBE).
The Webinar format offers VoIP and phone line connections. You will be able to talk directly with our team of experts and see our cursor pointing to discussion topics and photos in the slides.
January 27, 2010, 3:00 pm
Speakers: Terry Welsher, Danglemayer Associates, LLC
Location: 3M Innovation Center, 6801 River Place Blvd., Austin, TX 787
Developed by: Danglemayer Associates, LLC
More Info: Go to Central Texas ESD Chapter’s website
Charged-Board Events: Part Of An Increasingly Complex ESD Testing Landscape
Abstract
It has long been known that ICs and other ESD-sensitive components remain at risk when they are mounted onto printed-circuit boards and other assemblies. However, most ESD testing and characterization of these components has been done on stand-alone parts. Further, IC failure analysis data, which is based on knowledge of failure signatures seen in standard HBM and CDM tests, has caused many to conclude that ESD failures are relatively rare when compared to other electrical failures commonly classified as electrical overstress (EOS). Recent data and experience reported by several companies and laboratories now suggest that many failures previously classified as EOS may instead be the result of ESD failures due to Charged Board Events (CBE). A charged board stores much more energy than a device (IC) because its capacitance is many times larger. In fact, the charge (energy) transferred in the event is so large that it can cause EOS-like failures to the components on the board. In this seminar, this board-level ESD event will be compared with the component level CDM ESD event. The waveforms from both ESD events will be compared and it will be shown that for the same voltage, the current in the board-level ESD event will be much higher than that from the chip-level ESD event. A summary of literature and industry data will be given. It is suggested that failure analysts give stronger consideration to these types of board-level events before assigning an EOS diagnosis to the failure. This will support more effective root cause analysis and prevention of these failures. CBE is one of several new ESD testing directions that are not adequately covered by the standard HBM and CDM tests. This broader landscape will be reviewed and the status of the different directions will be described and challenges resulting from the technology road maps will be discussed.
December 8, 2009 (Note Date Change), 1:30 pm to 3:00 pm EST
Speakers:Ted Dangelmayer and Terry Welsher, Danglemayer Associates, LLC
Location: Online
Developed by: Danglemayer Associates, LLC
More Info: Go to PDF Flyer
Fees for Online Webinar:
$235 per registrant
FOUR WAYS TO REGISTER:
Phone - 1-978-283-5156 to order with a credit card
E-mail - Download, Complete and email the registration form to Vicki@dangelmayer.com
Fax - Download, Complete and fax the registration form to 1-978-282-4884
Mail - Download, Complete and mail registration form to:
Dangelmayer Associates, L.L.C.
14 Butternut Lane
Gloucester, MA 01930
All registrations must be prepaid and in U.S. Dollars prior to the Webinar.
ESD Webinar
Class 000* Measurements and Controls
Join us on December 8, 2009 (note date change) at 1:30 pm EST for this 90 minute highly interactive Webinar and learn how to prepare for the inevitable trend towards ultrasensitive components (Class 0, 00, 000) and about the wide spread lack of understanding regarding CDM (Charged Device Model). It is no longer business as usual and it can take up to two years to prepare.
Advanced auditing techniques and measurements will be discussed as well as innovative control methods for manufacturing. A case study will be presented which illustrates cost effective improvement that resulted in yield improvements as high as 22%.
This Webinar forum enables two-way discussions with the presenters as well as group interaction. Don't miss out on this exciting educational opportunity and come prepared with questions.
Nov 10, 2009 • 2:00 p.m. Eastern Time • Course length - one hour
Presenter: Terry Welsher, Danglemayer Associates, LLC
Location: Online
Developed by: Leo G. Henry, Ph.D. ESD & TLP Consultants, LLC and Terry Welsher, Danglemayer Associates, LLC
More Info: Go to ESD Association
Fees for Online Courses:
Members - $95.00 Per Course
Non-Members - $140.00 Per Course
Charged Board Events: A Growing Industry Concern
It has long been known that ICs and other ESD–sensitive components remain at risk when they are mounted onto printed–circuit boards and other assemblies. However, most ESD testing and characterization of these components has been done on stand–alone parts. Further, IC failure analysis data, which is based on knowledge of failure signatures seen in standard HBM and CDM tests, has caused many to conclude that ESD failures are relatively rare when compared to other electrical failures commonly classified as electrical overstress (EOS). Recent data and experience reported by several companies and laboratories now suggest that many failures previously classified as EOS may instead be the result of ESD failures due to Charged Board Events (CBE). A charged board stores much more energy than a device (IC) because its capacitance is many times larger. In fact, the charge (energy) transferred in the event is so large that it can cause EOS–like failures to the components on the board. In this seminar, this board–level ESD event will be compared with the component level CDM ESD event. The waveforms from both ESD events will be compared and it will be shown that for the same voltage, the current in the board–level ESD event will be much higher than that from the chip–level ESD event. A summary of literature and industry data will be given. It is suggested that failure analysts give stronger consideration to these types of board level events before assigning an EOS diagnosis to the failure. This will support more effective root cause analysis and prevention of these failures.
October 14, 2009
IEEE Boston Reliability Chapter monthly meeting
Location:RSA, the Security Division of EMC Corp., Bedford MA
Speaker:Ted Dangelmayer, Dangelmayer Associates, L.L.C
More Info: Go to PDF Flyer
IEEE Boston Reliability chapter October Joint meeting with ESDA Northeast
Common ESD Myths and Pitfalls of ESD Measurement Instruments
Agenda:
5:30-6:00 Sign In, personal networking, food & refreshments
6:00-6:10 Welcoming remarks, chapter announcements, presenter introduction
6:10-7:30 Featured guest presenter- Ted Dangelmayer
7:30-8:00 Q&A session, meeting adjourns
July 22 & 23, 2009
Annual North American Workshop
Location: Gloucester, MA
Facility Information: http://www.rsa.com/node.aspx?id=1059#Bedford
Time: 5:30PM
Speaker: G. Theodore Dangelmayer
More Info: Go to PDF Flyer
Annual North American Workshop
June 4, 2009 . 2:00 p.m. Eastern Time . Course length - one hour
Location: On-Line Training
Presenter:
Leo G. Henry, Ph.D. ESD&TLP Consultants, LLC
Developed by::
Leo G. Henry, Ph.D. ESD&TLP Consultants, LLC and
Terry Welsher, Danglemayer Associates, LLC
Offered by the ESD Association
More Info: Go to the PDF Flyer
Charged Board Events: A Growing Industry Concern
It has long been known that ICs and other ESD-sensitive components remain at risk when they are mounted onto printed-circuit boards and other assemblies. However, most ESD testing and characterization of these components has been done on stand-alone parts. Further, IC failure analysis data, which is based on knowledge of failure signatures seen in standard HBM and CDM tests, has caused many to conclude that ESD failures are relatively rare when compared to other electrical failures commonly classified as electrical overstress (EOS). Recent data and experience reported by several companies and laboratories now suggest that many failures previously classified as EOS may instead be the result of ESD failures due to Charged Board Events (CBE). A charged board stores much more energy than a device (IC) because its capacitance is many times larger. In fact, the charge (energy) transferred in the event is so large that it can cause EOS-like failures to the components on the board. In this seminar, this board-level ESD event will be compared with the component level CDM ESD event. The waveforms from both ESD events will be compared and it will be shown that for the same voltage, the current in the board-level ESD event will be much higher than that from the chip-level ESD event. A summary of literature and industry data will be given. It is suggested that failure analysts give stronger consideration to these types of board level events before assigning an EOS diagnosis to the failure. This will support more effective root cause analysis and prevention of these failures.
March 18, 2009 . 2:00 p.m. Eastern Time
Class 0 & CDM Trends and Counter Measures
Location:On-Line Training
Instructor: G. Theodore Dangelmayer
Offered by the ESD Association
More Info: Go to the PDF Flyer
Class 0 & CDM Trends and Counter Measures
Learn how to prepare for the trend towards extensive use of ultra-sensitive components (Class 0) and the wide spread lack of understanding about CDM (Charged Device Model). It is no longer business as usual and it can take up to two years (example-equipment retooling etc) to prepare. Join us for this presentation and learn why this is inevitable and how to prepare for it.
Get the answers to your questions as well as these examples. Are you skeptical about this news of a Class 0 trend? Is it really happening? Is it likely to be a problem in your factory? How big a problem is CDM in manufacturing? What is different about CDM controls? How do I tailor S20.20 for CDM and Class 0?
Instructor: Ted Dangelmayer, Dangelmayer Associates, L.L.C.
2008
July 23 & 24, 2008
Annual North American Workshop
Location: Gloucester, MA
Speaker: G. Theodore Dangelmayer
More Info: Go to PDF Flyer
Annual North American Workshop
CDM & Class 0 & S20.20 Highly Interactive ESD Workshop
Hands-on ESD Workshop with the Dream Team: CDM & Class 0 & S20.20, Issue 2 Learn How to Prepare for the "Perfect ESD Storm" that is brewing in the Electronics Industry! The Industry trend towards extensive use of ultra-sensitive components (Class 0) and the wide spread lack of CDM understanding are brewing the "Perfect ESD Storm"! Join the "ESD Dream Team" in this highly interactive workshop and learn why this is inevitable and how to prepare for it. You will also learn what is new with S20.20, Issue 2 - strengths and technical gaps. Intended For Professionals Who:
- Have Achieved Basic Knowledge Of ESD
- Understand Its Potential For Damage
- Desire Roadmap For Current And Future Protection
- Need A Better Understanding of CDM and S20.20
- What You Will Learn:
- CDM (Charged Device Model) & Class 0 Basics
- Why Industry Trend Toward Class 0 Is Inevitable
- Over 95% of ESD Failures are CDM
- Confirmed by Failure Mode Analysis
- How To Prepare For the ESD "Perfect ESD Storm"
- CDM & Class 0
- Hands-On CDM & Class 0 Test Methods
- What's New with ESDA S20.20, Issue 2 -2007
- Strengths and Technical Gaps
- How To Tailor the Technical Gaps
- How to Develop and Implement Sound ESD Programs
May 6-8, 2008
ESDA Tutorials
Location: Tyngsboro, MA
Speaker: G. Theodore Dangelmayer
ESD Basics for the Program Manager
May 6, 2008, 8:30 a.m. - 4:30 p.m.
Instructors: Ted Dangelmayer, Terry Welsher, Dangelmayer Associates, L.L.C.
This tutorial consists of three sections. Section A defines the causes of ESD and critical elements related to charge generation, material characteristics and electrostatic phenomenon. Section B explains and demonstrates the four critical device failure models. Section C provides an overview of device protection during handling and product assembly, a summary of ESD control elements, and a fundamental overview of S20.20 program requirements. This full day course is required for those in-plant auditors and program managers who are working toward professional ESD certification. Contact ESDA.org
April 17, 2008
Surface Mount Technology Association Expo
Location: Atlanta, GA
Speaker: Dangelmayer Associates
ESD Controls and Class 0 Parts
Dangelmayer Associates will present "ESD Controls and Class 0 Parts"
March 19, 2008
Northeast Chapter of ESDA Program/ ESD Test Equipment Workshop: Part 2
Uses and Pitfalls of ESD Measurements
Location: Lowell, MA
Speakers: Ted Dangelmayer, Dangelmayer Associates, L.L.C. and Vaughn Gross, Green Mountain Labs
More Info:Contact Vicki@dangelmayer.com
Northeast Chapter of ESDA Program/ ESD Test Equipment Workshop: Part 1
Uses and Pitfalls of ESD Measurements
Feb. 13, 2008
Northeast Chapter of ESDA Program/ ESD Test Equipment Workshop: Part 1
Uses and Pitfalls of ESD Measurements
Location: Lowell, MA
Speakers: Ted Dangelmayer, Dangelmayer Associates, L.L.C. and Vaughn Gross, Green Mountain Labs
More Info:Contact Vicki@dangelmayer.com
Northeast Chapter of ESDA Program/ ESD Test Equipment Workshop: Part 1
Uses and Pitfalls of ESD Measurements
February 4-6, 2008
Defense Manufacturing Summit
Location: Las Vagas, NV
Speaker: G. Theodore Dangelmayer
Defense Manufacturing Summit
Ted Dangelmayer will present "The Perfect ESD Storm" as a guest speaker at the Defense Manufacturing Summit.
2007
Wednesday, September 19, 2007, 4:00 - 4:30 PM - NEW! BOOK SIGNING EVENT TO BE HELD AT THE 2007 EOS/ESD SYMPOSIUM!
Location: Disneyland Hotel in Anaheim, CA
Author: G. Theodore Dangelmayer
Book: ESD Program Management, 2nd Edition
- This revision is comprehensive and explains how to develop, implement and manage an ESD control program, and includes up-to-date data, many new chapters, new case studies, and much more.
For further information, please visit the linked ESDA THRESHOLD™.
The ESD Association is proud to announce its first Book Signing, to take place during the 29th Annual EOS/ESD Symposium, September 16 - 21, 2007, at the Disneyland Hotel in Anaheim, CA.
Leading authors and educators in today's ESD Industry will be signing their books at the ESD Association Sales Booth, located in the Disneyland Hotel, EOS/ESD Symposium Registration Area.
Check out the schedule below and be sure to take advantage of this opportunity to meet authors in person, ask questions, and have your books signed!
We look forward to seeing you there!
September 16-21, 2007 - Tutorial: “The Perfect ESD Storm” - EOS/ESD Symposium.
Location: Disneyland Hotel in Anaheim, CA
Speakers: Ted Dangelmayer
For further information, please visit the linked ESDA THRESHOLD™.
Hands-on ESD Workshop with Ted Dangelmayer, North America CDM/ Class 0 workshop. Interactive, individualized, and highly informative, expert and all-inclusive training will prepare you for Phase 2 of the ESD storm ahead.
November 15th, 2007 - “The Perfect ESD Storm”
Event: The 40th International Symposium on Microelectronics
Location: McEnery Convention Center - San Jose, California USA
Session: THA4-A Electrostatic Discharge Protection
Time: 8:50 AM - 12:00 PM
Speakers: Ted Dangelmayer
For further information, please visit the linked The 40th International Symposium on Microelectronics.
Presention: technical paper "The Perfect ESD Storm", Electrostatic Discharge Protection.
September 16-21, 2007 - EOS/ESD Symposium. The 2007 EOS/ESD Symposium will work its magic in Anaheim, California. The Disneyland Hotel will host the 29th annual event.
Location: Anaheim, California
Speakers: T.B.A.
For further information, please visit the linked ESDA THRESHOLD™.
Recognized as the international forum for furthering the understanding of electric overstress and electrostatic discharge, the annual EOS/ESD Symposium attracts attendees and participants from throughout the world.
Focusing on technology and solutions, the EOS/ESD Symposium covers a broad base of interests including industrial, computer, communications, and military electronics; web processing; cleanrooms; semiconductors, MR/Storage devices; and electronic systems, components, and equipment.
July 25-26, 2007 - CDM + Class 0 = "The Perfect ESD Storm" Workshop
Location: Cape Ann, Gloucester, MA
Speakers: The Dream Team - Dangelmayer Associates L.L.C.
If you have questions, please contact Vicki Dangelmayer.
Hands-on ESD Workshop with the Dream Team:
North America CDM/ Class 0 workshop. Interactive, individualized, and highly informative, the "Dream Team" expert and all-inclusive training will prepare you for Phase 2 of the ESD storm ahead.
May 22nd, 23rd and 24th, 2007 - NE Chapter is holding an Regional Tutorial Program jointly with the ESDA
Location: Tyngsboro, MA
Speakers: Steve Voldman, Warren Anderson, Steve Halperin and Mike Hopkins
If you have questions, please contact Vicki Dangelmayer.
Further Information can be found on Page 2 of this linked PDF document
RF On-Chip ESD Protection Design and Test - May 22
Troubleshooting On-Chip ESD Failures - May 22
ESD Basics for the Program Manager - May 23
Packaging Principles for the Program Manager - May 24
System Level ESD/EMI:Testing to IEC and Other Standards - May 24
April 4th, 5th and 6th, 2007 - Workshop
Location: Korea
Speakers: Ted Dangelmayer - Dangelmayer Associates L.L.C.
If you have questions, please contact Vicki Dangelmayer.
Learn how to prepare for the "Perfect ESD Storm" that is brewing in the electronics industry! The trend towards extensive use of ultra-sensitive components (Class 0) and the wide spread lack of CDM (Charged Device Model) understanding are brewing the "Perfect ESD Storm"! It is no longer business as usual and it can take up to two years to prepare. Join us for this highly interactive tutorial and learn why this is inevitable and how to prepare for it.
March 25th - 29th, 2007 - Electrostatics 2007 Conference
Location: St Catherine's College, Oxford, UK
For further information, please visit linked Announcement for contact info at the bottom of this Call for Papers.
This conference is organised by the Electrostatics Group of the Institute of Physics and continues the International Conference series on Electrostatics which takes place in the United Kingdom every four years.
March 21, 2007 (backup date: March 14)
Location: Zoll Medical Factory
NE Chapter of the ESD Association Event - Zoll Medical Factory Tour
March 5, 2007 - WORKSHOP: Electrostatic Issues in Semiconductor Manufacturing
1:30pm - 5:30pm (1330 - 1730)
Location: Boston Marriott Quincy, Quincy, MA
Speakers: Lou DeChiaro and Terry Welsher - Dangelmayer Associates
For More information, please visit the below SEMI link: Semiconductor Equipment and Materials International
March 5, 2007 - WORKSHOP: Electrostatic Issues in Semiconductor Manufacturing
1:30pm - 5:30pm (1330 - 1730)
Location: Boston Marriott Quincy, Quincy, MA
Speakers: Ted Dangelmayer - Dangelmayer Associates
For More information, please visit the below SEMI link: Semiconductor Equipment and Materials International
February 20, 2007, Tues, 4:00pm - Seminar on "ESD Auditing -2007", for the The Silicon Valley EOS/ESD Society's BOARD MEETING
Location: SIVA-ESD, Ramada Inn, 1217 Wildwood Ave, Sunnyvale, CA 94089
Speakers: Larry Fromm
For further information, please visit The Silicon Valley EOS/ESD Society's website.
ESD Auditing -2007
January 31, 2007 - NE Chapter Meeting
Location: Thermal, Lowell, MA
Speakers: Vaughn Gross & Ted Dangelmayer
For further information, please visit The NE Chapter of the ESD Association.
Basic ESD test instruments and how to use them. Event detector and static locator